Imaging Solutions for Nanomechanical Testing
Advanced Optical and Scanning Probe Microscopy for Material Analysis
The NanoTest™ Vantage™ and Xtreme™ instruments offers multiple integrated imaging options.
Optical microscopy allows quick and easy test site selection and post-experiment sample inspection. It is combined with a highly accurate sample positioning system allow sub-micron relocation of the sample between the microscope and the indenter.
Also available are two scanning probe microscopy techniques; (i) SPM/Nanopositioner and (ii) AFM. These provide the ability to image sub-optically-resolvable features and then to place measurements at selected point with nanometre scale accuracy.

All NanoTest™ Vantage™ and Xtreme™ instruments have optical microscopes.
Sample navigation is achieved using an intuitive software interface or by simply clicking on the image.
Start or centre points for indentation grids may be defined or individual test sites selected.
The objective lenses have long working distances so multiple samples of differing thicknesses maybe mounted and worked on simultaneously.
The SPM/Nanopositioner allows 3-D imaging of sample surfaces and measurements site selection with nanometre precision.
This example shows how the hardness of a selected region of an additive manufactured Ti-20at.%Nb composite.
Step 1; A 4 µm x 4 µm region of interest is imaged using the SPM/Nanopositioner.
Step 2; Indentation locations defined from the image.
Step 3; Indentations are performed.
Step 4; Indentation results are mapped
All steps are undertaken within the NanoTest™ software.


5 µm x 5 µm nanopositioner image of a single-crystal Ni-based superalloy.
Test locations within the matrix (γ) and precipitate (γ’) phases were chosen from the image as these are too small for optical targeting.
Clear differences in hardness and elastic modulus between the γ and γ’ phases were shown.
An AFM can be integrated onto the NanoTest™ Vantage™ platform for imaging of test sites.
The integration allows accurate and automated relocation of the sample between the indenter, the optical microscope and the AFM.

Explore More
To further enhance your experience and understanding, we invite you to check out the following pages on our website that we believe are essential to your journey with us:
- High-Temperature Nanoindentation Testing for Advanced Material Characterization
- Advanced Nano Scratch and Wear Testing for Coatings and Materials
- Nano-Impact Testing for Advanced Material Performance in High-Stress Applications
These pages offer valuable insights and resources to help you achieve your goals.