NEW PAPER – Statistically distributed nano-scratch testing of AlFeMnNb, AlFeMnNi and TiN/Si3N4 thin films on silicon
Ben D. Beake, Stephen R. Goodes, Vladimir M. Vishnyakov, Azadeh Taher Rahmati just published in JVST:A (Vol 42, Issue1) 2024.
https://doi.org/10.1116/6.0003189
The paper describes how statistically distributed nano-scratch testing was carried out on high entropy alloys and nanocomposite thin films on silicon, providing a more direct measure of abrasion resistance than standard nano-scratch tests.
The paper was published in a Special Collection honouring the major contributions of Professor Joe Greene, University of Illinois, to the understanding of of the physics, chemistry and materials science of thin films.