In order to target/ avoid specific structures on samples, the NanoTest Vantage is equipped with several imaging options. These options are also useful for reviewing residual damage post indent/ scratch/ impact.
The system is equipped with a multiple objective microscope and side-view optics as standard, and the user can then choose to add additional capability such as high temperature optics, an in-situ 3D profiler, or an AFM.
Images taken on wood cells using the four lenses on the multiple objective microscope. Images can then be used to position indent sites.
The sample stage features five pre-set positions:
The sample (6) automatically moves between the loading heads and the imaging modules via software control. The high accuracy stages used by the Vantage guarantees a repositioning accuracy of 200nm.
The NanoTest is supplied with a multiple objective microscope, and side-view optics as standard. The multiple objective microscope has four lenses mounted in a precision turret, lenses are selected via the software. This allows rough and precise positioning on your sample quickly and easily.
Indents on a cast iron sample. Indents were precisely placed using the optical microscope in order to avoid the ferrite/perlite structures seen on the sample.
The view from the side-view optics, which allow visualisation of probe-sample contact.
A single objective optical microscope for use in conjunction with the high temperature stage.
Allows 3D images to be created in-situ. A piezo-driven stage behind the sample moves the sample across the probe, building up a 3D image.
This also doubles as a nanopositioning stage, giving a sample repositioning accuracy of 3nm. Scan range is 200µm x 200µm. The 3D profiler is compatible with the hot stage.
A dedicated AFM, mounted alongside the loading heads. Scan Range 110µm x 110µm. Available in contact only or contact/non-contact modes.
Our support literature for Imaging Options testing will provide a great introduction to the NanoTest Vantage, learn how you could be taking advantage.
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