2D and 3D Imaging
In order to target/avoid specific structures or features on samples, the NanoTest Vantage is equipped with several imaging options. These options are also useful for reviewing residual damage post indent/ scratch/ impact.
The system is equipped with a multiple objective microscope and side-view optics as standard, and the user can then choose to add additional capability such as high temperature optics, an in-situ 3D profiler, or an AFM.
How it works
The sample stage features five pre-set positions:
- 1: High temperature optics
- 2: Low Load Head
- 3: AFM
- 4: High Load Head
- 5: Multiple Objective Microscope
The sample (6) automatically moves between the loading heads and the imaging devices via software control. The high accuracy stages used by the NanoTest Vantage provides a resolution of 20 nm and a re-positioning accuracy of 400 nm.
Standard Optics on the NanoTest Vantage
The NanoTest is supplied with a multiple objective microscope, and side-view optics as standard. The multiple objective microscope has four lenses mounted in a precision turret, lenses are selected via the software. This allows wide and precise positioning on your sample quickly and easily.