The MicroTestTM
The unique open platform of the NanoTest system allows one or two separate loading heads to be mounted side by side. The NanoTest loading head, also known as the low load head, covers the force range 0.01mN – 500mN. The MicroTest loading head, known as the high load head, allows the user to apply forces of 0 – 20N, thus extending the range of the system into the micro-hardness range.
As both loading heads may be mounted simultaneously there is no need to physically swap one for another, meaning the user can easily move between load ranges.
Techniques possible with the MicroTestTM
The MicroTest head may be combined with all the testing capabilities of the NanoTest, allowing the user to carry out:
- Microindentation
- Micro scratch and wear testing
- Micro impact and fatigue
- High temperature microindentation to 500 degrees Celsius
- High temperature micro scratch and wear
- High temperature micro impact and fatigue
The MicroTest can be supplied in conjunction with a NanoTest or as a standalone system.
Further Reading
Characteristics of intermetallics and micromechancial properties during thermal ageing of Sn-Ag-Cu flip-chip solder interconnects, D Li, C Liu, PP Conway, Materials Science and Engineering A, 2005 (A319) 95-103
Investigation of high-temperature plastic deformation using instrumented microindentation tests. Part II: The deformation of AI-based particulate reinforced composites at 473 K to 833 K, V Bhakhri, RJ Klassen, Journal of Materials Science, 2006 (41) 2249-2258.
Substrate temperature effects on the microhardness and adhesion of diamond-like thin films, E Martinez, MC Polo, E Pascual, J Esteve, Diamond and Related Materials, 1999 (8) 563-566.
