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The Micro Materials
NanoTest
Platform Design
nanotest, nanoindentation,
nano-hardness tester, nanoindentation tester, microindentation, scratch
test, micro materials, hardness, modulus, friction, wear, scanning probe
microscope, wear, nanoindenter nanoscratch |
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nanotest, nanoindentation, nano-hardness
tester, nanoindentation tester, microindentation, scratch test, micro
materials, hardness, modulus, friction, wear, scanning probe
microscope, wear, nanoindenter |
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Click here for
PowerPoint information
The Micro Materials NanoTest platform has been designed
to support our three modules of
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Indentation for nanoindentation, nano- and micro-hardness testing,
reduced modulus...
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Scratch for scratch testing, thin
film wear resistance...
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Impact for thin film adhesion failure, erosive wear and contact
fatigue...
The modular design
allows you to choose the NanoTest for your specific needs - for further
information download a description of possible NanoTest configurations - customising your NanoTest System.
The NanoTest can be easily upgraded and expanded with new developments. Its
reliability and precision are proving equally popular in fundamental
research studies as they are in quality applications. If you would like to
receive a free copy of our new NanoTest brochure please contact us by e-mail
at
info@micromaterials.co.uk
Choose the Micro
Materials NanoTest System for...
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Reliability
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Performance
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Versatility
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Upgradeability
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Options for the NanoTest include...
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High Temperature
Stage
Room temperature to over 500°C sample heating stage, probe heater, thermal
barrier and high temperature capacitor assembly. For high temperature
nanoindentation, scratch and impact testing.
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Intermittent
Contact (AC) Atomic Force Microscope
Highly linear up to 200 x 200 µm SPM scanner with Z range up to 15 µm. 0.5% vertical
linearity across whole scan range. AC (non-contact and intermittent
contact mode) and DC (Contact, Lateral Force) modes. Cantilever end radius
<20nm.
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MicroTest High Load Head
Load ranges 0-2 N and 0-20 N. Can be fitted alongside the NanoTest head.
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Nanopositioner
In-situ 3D imaging and scanning with integrated XYZ piezo Flexure stage. 200mm x 200mm x 20mm
x,y,z stage; x,y stage resolution 2nm; z resolution 0.1nm; closed loop
linearity 0.03%.
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Continuous
Contact Compliance Calculation
Lock-in amplifier and sample oscillation system. Oscillation frequency
range up to 250 Hz.
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Spherical
Indentation Package
Spherical indenter and analysis software to calculate plastic depth,
hardness vs. penetration depth, creep and stress-strain.
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Automatic 2D Sample Levelling Stage
Recommended for hardness/modulus and essential for roughness/topography on
curved/uneven samples.
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High Resolution
and x230 Microscopes and Video Capture
High resolution x1250 with accurate repositioning and sample translation. Video x230
magnification. Video or USB capture features to allow for image storage.
If you would like to receive a new technical note describing the
specifications of both the microscope options please contact us by e-mail
at info@micromaterials.co.uk
or download a
PDF copy.
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Pin-on-Disk
<<1 rpm - 3600 rpm pin-on-disk assembly with high torque motor and
gearbox, and software for control of speed, acceleration, time, load,
depth and track location.
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...Excellence in Manufacture
All our NanoTest instruments are built from control units manufactured
to the ISO9000 standard.
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